On Thu, Jun 23, 2011 at 10:12 AM, Luck, Tony <tony.luck@intel.com> wrote:

> > I don't think it makes sense to handle something like that with a list.
> > The compact representation currently in badram is great for that.
>
> I'd tend to agree here.  Rick has made a convincing argument that there
> are significant numbers of real world cases where a defective row/column
> in a DIMM results in a predictable pattern of errors.  The ball is now
> in Google's court to take a look at their systems that have high numbers
> of errors to see if they can actually be described by a small number
> of BadRAM patterns as Rick has claimed.
>
>
Hi All,

We (Google) are working on a data-driven answer for this question.  I know
that there has been some analysis on this topic on the past, but I don't
want to speculate until we've had some time to put all the pieces together.
 Stay tuned for specifics.

Cheers,
CraigB



> -Tony
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